PROCEEDINGS VOLUME 2004
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 11-16 JULY 1993
Interferometry VI: Applications
Editor Affiliations +
SPIE'S 1993 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
11-16 July 1993
San Diego, CA, United States
Keynote Session
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172581
Nondestructive Testing
James P. Nokes, Gary L. Cloud
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172592
Y.Y. Hung, Kahwah Long
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172602
Robert Czarnek
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172609
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172615
Displacement, Deformation, Distance, and Shape Measurement
Ramon Rodriguez-Vera, David Kerr
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172616
Paul W. Southard, H. Philip Stahl
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172617
Thomas Bischof, Werner P. O. Jueptner
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172618
Wolfgang Holzapfel, Werner Baetz, Jan Christian Braasch
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172582
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172583
Rotation and Vibration Measurement
Gordon M. Brown, Jamie Warren Forbes, Mitchell M. Marchi, Raymond R. Wales
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172584
Xavier Bohineust, Virginie Linet, Frederic Dupuy
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172585
Kim D. Bennett, R. C. Winters, Ru Z. Chen
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172586
Richard W. T. Preater, Robin C. Swain
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172587
Michele Arturo Caponero, Alberto De Angelis, V. R. Filetti, S. Gammella
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172588
Surface Characterization
Dirk-Roger Schmitt, Gabriele A. Ringel, Frank Kratz
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172589
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172590
Siak-Piang Lim, Wei Min Shi
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172591
Yan Liu, Jingwu Xuong, Gengxian He
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172593
Mechanics and Tomography
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172594
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172595
Arup K. Maji, Debashis Satpathi, S. Zawaydeh
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172596
Anthony L. Collins, M. W. Collins, James C. Hunter
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172597
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172598
Materials Testing
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172599
Konstatin Galanulis, Reinhold Ritter
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172600
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172601
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172603
Thin Films and Nanomeasurements
Gordon C. Brown, Ryszard J. Pryputniewicz
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172604
Jeffrey T. Fanton, Jon L. Opsal, Allan Rosencwaig, David Willenborg
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172605
Christopher David Wright, Warwick W. Clegg, S. T. Cheng, P. J. Crozier, M. J. Cunningham, E. W. Hill, Kazuhiko Hayashi, J. K. Birtwistle
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172606
Anatol N. Golubev
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172607
Bao Hua Zhuang, Ji-Hua Zhang, Zhen Li, Keqian Lu
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172608
Surface Characterization
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172610
Materials Testing
Jing Fang, Karl-Hans Laermann, Fulong Dai
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172611
Displacement, Deformation, Distance, and Shape Measurement
Jian Lu, Xiao-Wu Ni, Anzhi He
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172612
Thin Films and Nanomeasurements
Serguei A. Alexandrov, Leonid Victorovic Tanin
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172613
Proceedings Volume Interferometry VI: Applications, (1994) https://doi.org/10.1117/12.172614
Back to Top