PROCEEDINGS VOLUME 2265
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 24-29 JULY 1994
Polarization Analysis and Measurement II
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
24-29 July 1994
San Diego, CA, United States
Advances in Polarimetry
Proc. SPIE 2265, Standard polarization components: progress toward an optical retardance standard, 0000 (14 September 1994); doi: 10.1117/12.186653
Proc. SPIE 2265, Principal angles and principal azimuths of an in-line symmetric three-reflection bare-mirror system: application to circular polarization of VUV radiation, 0000 (14 September 1994); doi: 10.1117/12.186661
Proc. SPIE 2265, Polarization alignment of polarization maintaining fiber using coherent detection, 0000 (14 September 1994); doi: 10.1117/12.186672
Proc. SPIE 2265, Fast imaging polarimetry with precision universal compensator, 0000 (14 September 1994); doi: 10.1117/12.186681
Proc. SPIE 2265, Spatiotemporal strain distribution mapping using novel optical heterodyne polarimeter, 0000 (14 September 1994); doi: 10.1117/12.186692
Proc. SPIE 2265, Fiber optic in-line polarimeter: system design and computer-aided analysis, 0000 (14 September 1994); doi: 10.1117/12.186700
Proc. SPIE 2265, Polariscope using the phase-shifting technique, 0000 (14 September 1994); doi: 10.1117/12.186701
Proc. SPIE 2265, Development and calibration of an optical fiber polarimeter, 0000 (14 September 1994); doi: 10.1117/12.186702
Polarization of Optical Elements and Materials I
Proc. SPIE 2265, New method for the determination of the G factor for a spectrophotofluorometer, 0000 (14 September 1994); doi: 10.1117/12.186654
Proc. SPIE 2265, Birefringent characteristics of two new crystalline materials: CeF3 and LaF3, 0000 (14 September 1994); doi: 10.1117/12.186655
Proc. SPIE 2265, Periodic and quasiperiodic nonquarterwave multilayer coating for 90-deg reflection phase retardance at 45-deg angle of incidence, 0000 (14 September 1994); doi: 10.1117/12.186656
Proc. SPIE 2265, Fabrication of two-dimensional rough surfaces for light scattering and polarization measurements, 0000 (14 September 1994); doi: 10.1117/12.186657
Proc. SPIE 2265, Polarimetry and scatterometry using a Wollaston polarimeter, 0000 (14 September 1994); doi: 10.1117/12.186658
Proc. SPIE 2265, Polarizer uniformity measurements taken with an imaging polarimeter, 0000 (14 September 1994); doi: 10.1117/12.186659
Polarization Analysis
Proc. SPIE 2265, Fresnel's interface reflection coefficients for the parallel and perpendicular polarizations: global properties and facts not found in your textbook, 0000 (14 September 1994); doi: 10.1117/12.186660
Proc. SPIE 2265, Progress in polarization ray tracing, 0000 (14 September 1994); doi: 10.1117/12.186662
Proc. SPIE 2265, Complex-amplitude noise characteristics of analog liquid crystal spatial light modulators, 0000 (14 September 1994); doi: 10.1117/12.186663
Proc. SPIE 2265, Ellipsometric measurements applied to liquid crystal display technology, 0000 (14 September 1994); doi: 10.1117/12.186664
Poster Session
Proc. SPIE 2265, Mueller matrix formalism in imagery: an experimental arrangement for noise reduction, 0000 (14 September 1994); doi: 10.1117/12.186665
Polarization Analysis
Proc. SPIE 2265, Ellipsometric measurements on SiO2 by intensity ratio technique, 0000 (14 September 1994); doi: 10.1117/12.186666
Polarization of Optical Elements and Materials II
Proc. SPIE 2265, Modulated interference effects: use of photoelastic modulators with lasers, 0000 (14 September 1994); doi: 10.1117/12.186667
Proc. SPIE 2265, Tunable birefringent filters using liquid crystal variable retarders, 0000 (14 September 1994); doi: 10.1117/12.186668
Proc. SPIE 2265, Compensation of extraordinary ray pencil astigmatism generated by a birefringent crystal in convergent beam, 0000 (14 September 1994); doi: 10.1117/12.186669
Poster Session
Proc. SPIE 2265, Evaluation of the spatial inhomogeneities of ferrofluid thin plates polarimetric characteristics for active imagery, 0000 (14 September 1994); doi: 10.1117/12.186670
Astronomy and Remote Sensing
Proc. SPIE 2265, Liquid Crystal Polarimeter for solid state imaging of solar vector magnetic fields, 0000 (14 September 1994); doi: 10.1117/12.186671
Proc. SPIE 2265, Zurich Imaging Stokes Polarimeters I and II, 0000 (14 September 1994); doi: 10.1117/12.186673
Proc. SPIE 2265, Use of Mueller and non-Mueller matrices to describe polarization properties of telescope-based polarimeters, 0000 (14 September 1994); doi: 10.1117/12.186674
Proc. SPIE 2265, Polarization sensitivity modeling of reflective imaging systems, 0000 (14 September 1994); doi: 10.1117/12.186675
Proc. SPIE 2265, Polarization effects in radiometry, 0000 (14 September 1994); doi: 10.1117/12.186676
Proc. SPIE 2265, Luminescent x-ray polarimeter, 0000 (14 September 1994); doi: 10.1117/12.186677
Mathematics of Polarization and Scattering
Proc. SPIE 2265, Special unitary groups in polarimetry theory, 0000 (14 September 1994); doi: 10.1117/12.186678
Proc. SPIE 2265, Effects of near-specular scattering on polarimetry, 0000 (14 September 1994); doi: 10.1117/12.186679
Proc. SPIE 2265, Optimum angles for a Mueller matrix polarimeter, 0000 (14 September 1994); doi: 10.1117/12.186680
Proc. SPIE 2265, Unified formalism for polarization optics: further developments, 0000 (14 September 1994); doi: 10.1117/12.186682
Proc. SPIE 2265, Lorentz group underpinnings for the Jones and Mueller calculi, 0000 (14 September 1994); doi: 10.1117/12.186683
Proc. SPIE 2265, Polarization analysis of depolarizing optical systems, 0000 (14 September 1994); doi: 10.1117/12.186684
Poster Session
Proc. SPIE 2265, Phase-shift control in electro-optical analyzers, 0000 (14 September 1994); doi: 10.1117/12.186685
Proc. SPIE 2265, One kind of error in modulational polarimetry, 0000 (14 September 1994); doi: 10.1117/12.186686
Proc. SPIE 2265, Light depolarization in optical waveguides with irregular boundaries of dielectric layers, 0000 (14 September 1994); doi: 10.1117/12.186687
Proc. SPIE 2265, Polarization-based devices in solar observations at the Sayan Observatory, 0000 (14 September 1994); doi: 10.1117/12.186688
Proc. SPIE 2265, Parametric resonance in optical resonator systems with anisotropic modulators, 0000 (14 September 1994); doi: 10.1117/12.186689
Proc. SPIE 2265, One method of imaging polarimetry for remote sensing purposes: the technique accuracy investigations, 0000 (14 September 1994); doi: 10.1117/12.186690
Proc. SPIE 2265, Anisotropically saturating nonlinearity of the polymer films with bacteriorhodopsin, 0000 (14 September 1994); doi: 10.1117/12.186691
Proc. SPIE 2265, Advance of the design and technology of birefringent filters, 0000 (14 September 1994); doi: 10.1117/12.186693
Proc. SPIE 2265, Chromatic dispersion characteristics of highly birefringent optical fibers, 0000 (14 September 1994); doi: 10.1117/12.186694
Proc. SPIE 2265, Investigation of stress-induced birefringence in large semiconductor wafers by imaging polarimetry, 0000 (14 September 1994); doi: 10.1117/12.186695
Proc. SPIE 2265, Instrumental polarization effects of the German Vacuum Tower Telescope (VTT) at Tenerife, 0000 (14 September 1994); doi: 10.1117/12.186696
Proc. SPIE 2265, Ultraviolet/visible polarimetric signatures for discrimination, 0000 (14 September 1994); doi: 10.1117/12.186697
Astronomy and Remote Sensing
Proc. SPIE 2265, Polarization errors associated with birefringent waveplates, 0000 (14 September 1994); doi: 10.1117/12.186698
Proc. SPIE 2265, Polarization characteristics of the NASA Marshall Space Flight Ctr. (MSFC) Experimental Vector Magnetograph, 0000 (14 September 1994); doi: 10.1117/12.186699
Back to Top