PROCEEDINGS VOLUME 5182
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING | 3-8 AUGUST 2003
Wave-Optical Systems Engineering II
IN THIS VOLUME

0 Sessions, 28 Papers, 0 Presentations
Modelling I  (4)
Modelling II  (3)
Applications  (4)
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING
3-8 August 2003
San Diego, California, United States
Modelling I
Proc. SPIE 5182, Comments on wave-optical engineering, 0000 (31 December 2003); doi: 10.1117/12.511937
Proc. SPIE 5182, Use of ray tracing in wave-optical engineering, 0000 (31 December 2003); doi: 10.1117/12.511644
Proc. SPIE 5182, Local spherical interface approximation in the analysis of field propagation through modulated interfaces, 0000 (31 December 2003); doi: 10.1117/12.509476
Proc. SPIE 5182, Wave-optical engineering with VOL4 VirtualLab, 0000 (31 December 2003); doi: 10.1117/12.511643
Modelling II
Proc. SPIE 5182, Wigner optics and wave optics: fundamentals and practical applications, 0000 (31 December 2003); doi: 10.1117/12.509133
Proc. SPIE 5182, Optical vortex trajectories through paraxial modal analysis, 0000 (31 December 2003); doi: 10.1117/12.503583
Proc. SPIE 5182, Propagation of electromagnetic fields between nonparallel planes, 0000 (31 December 2003); doi: 10.1117/12.511647
Image Forming
Proc. SPIE 5182, Wave-optical considerations in photolithography, 0000 (31 December 2003); doi: 10.1117/12.508622
Proc. SPIE 5182, Lithographic image simulation for the 21st century with 19th-century tools, 0000 (31 December 2003); doi: 10.1117/12.511969
Proc. SPIE 5182, Mask and source optimization for lithographic imaging systems, 0000 (31 December 2003); doi: 10.1117/12.504732
Proc. SPIE 5182, Optimized visualization of phase objects with semiderivative real filters, 0000 (31 December 2003); doi: 10.1117/12.508625
Proc. SPIE 5182, Point spread function engineering in confocal scanning microscopy, 0000 (31 December 2003); doi: 10.1117/12.510209
General Design I
Proc. SPIE 5182, Challenges in industrial applications of diffractive beam splitting, 0000 (31 December 2003); doi: 10.1117/12.511638
Proc. SPIE 5182, Polarization modulation by subwavelength-structured space-variant dielectric interfaces, 0000 (31 December 2003); doi: 10.1117/12.509495
Proc. SPIE 5182, Investigation of multimode dispersionless beams, 0000 (31 December 2003); doi: 10.1117/12.509077
Proc. SPIE 5182, Scaled optical Fourier transform: practical limitations, 0000 (31 December 2003); doi: 10.1117/12.509134
General Design II
Proc. SPIE 5182, Laser-mode engineering by generalized resonator concepts, 0000 (31 December 2003); doi: 10.1117/12.505490
Proc. SPIE 5182, Intracavity beamshaping in waveguide lasers, 0000 (31 December 2003); doi: 10.1117/12.505785
Proc. SPIE 5182, Design for shaping, splitting, and diffusing light: a comparison, 0000 (31 December 2003); doi: 10.1117/12.511938
Applications
Proc. SPIE 5182, Wave-optical components for reconfigurable short-distance optical interconnects, 0000 (31 December 2003); doi: 10.1117/12.511968
Proc. SPIE 5182, Optical wave engineering for nanoscale surface metrology, 0000 (31 December 2003); doi: 10.1117/12.511601
Poster Session
Proc. SPIE 5182, Diamond DOEs for focusing IR laser beams into pregiven focal domains, 0000 (31 December 2003); doi: 10.1117/12.509069
Applications
Proc. SPIE 5182, Optical scanning cryptography, 0000 (31 December 2003); doi: 10.1117/12.511848
Proc. SPIE 5182, Design and experiments of planar optical light guides for virtual image displays, 0000 (31 December 2003); doi: 10.1117/12.509330
Poster Session
Proc. SPIE 5182, Design and optimization considerations of multi-focus phase-only diffractive elements, 0000 (31 December 2003); doi: 10.1117/12.505573
Proc. SPIE 5182, High-order Bessel beam generation using a Mach-Zehnder interferometer, 0000 (31 December 2003); doi: 10.1117/12.506379
Proc. SPIE 5182, Phase diffractive filter to analyze an output step-index fiber beam, 0000 (31 December 2003); doi: 10.1117/12.509468
Proc. SPIE 5182, Characterization of thin films nonuniform in optical parameters by spectroscopic digital reflectometry, 0000 (31 December 2003); doi: 10.1117/12.509628
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