PROCEEDINGS VOLUME 8495
SPIE OPTICAL ENGINEERING + APPLICATIONS | 12-16 AUGUST 2012
Reflection, Scattering, and Diffraction from Surfaces III
Proceedings Volume 8495 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8495
Proc. SPIE 8495, Front Matter: Volume 8495, 849501 (15 October 2012); doi: 10.1117/12.2013258
Scattering Theory I
Proc. SPIE 8495, Domain of validity of the equation for total integrated scatter (TIS), 849502 (15 October 2012); doi: 10.1117/12.930566
Proc. SPIE 8495, Upper roughness limitations on the TIS/RMS relationship, 849503 (15 October 2012); doi: 10.1117/12.930770
Proc. SPIE 8495, Comparison of the domain of validity of several approximate surface scatter theories, 849504 (15 October 2012); doi: 10.1117/12.930558
Proc. SPIE 8495, Converting surface roughness data into PSD and BSDF, 849505 (15 October 2012); doi: 10.1117/12.931671
Imaging Methods and Applications I
Proc. SPIE 8495, Design of combined microscopical and scatterometrical imaging device of surface inspection, 849506 (15 October 2012); doi: 10.1117/12.929473
Proc. SPIE 8495, Backscatter based projectile trajectory measurement under daylight conditions, 849507 (15 October 2012); doi: 10.1117/12.930146
Proc. SPIE 8495, Surface characterization using combined analysis of original and scatter image, 849508 (15 October 2012); doi: 10.1117/12.929472
Optical Properties: Theory and Measurement
Proc. SPIE 8495, Inter-laboratory comparison using integrating sphere spectrophotometers to measure reflectance and transmittance of specular, diffuse, and light-redirecting glazing products, 849509 (15 October 2012); doi: 10.1117/12.932104
Proc. SPIE 8495, Comparison of NRC goniometric and integrating sphere methods for realizing an absolute diffuse reflectance scale, 84950A (15 October 2012); doi: 10.1117/12.930794
Proc. SPIE 8495, Effective medium analysis on the optical properties of silicon nanowire arrays, 84950C (15 October 2012); doi: 10.1117/12.930881
Scattering Theory II
Proc. SPIE 8495, Estimating hemispherical scatter from incident plane measurements of isotropic samples, 84950F (15 October 2012); doi: 10.1117/12.930773
Proc. SPIE 8495, A BRDF model for scratches and digs, 84950G (15 October 2012); doi: 10.1117/12.930860
Proc. SPIE 8495, Surface-plasmon mediated near-field light diffraction, 84950H (15 October 2012); doi: 10.1117/12.927772
Proc. SPIE 8495, How accurate is the Kubelka-Munk theory of diffuse reflection? A quantitative answer, 84950I (15 October 2012); doi: 10.1117/12.929948
Measurement Instrumentation and Applications I
Proc. SPIE 8495, Tunable supercontinuum fiber laser source for BRDF measurements in the STARR II gonioreflectometer, 84950K (15 October 2012); doi: 10.1117/12.930742
Proc. SPIE 8495, Scatterometer basing on a STAR GEM idea for optical measurements of microlenses, 84950M (15 October 2012); doi: 10.1117/12.932244
Proc. SPIE 8495, The Southwest Research Institute ultraviolet reflectance chamber (SwURC): a far ultraviolet reflectometer, 84950N (15 October 2012); doi: 10.1117/12.930184
Imaging Methods and Applications II
Proc. SPIE 8495, The focusing of light scattered from diffuse reflectors using phase modulation, 84950O (15 October 2012); doi: 10.1117/12.929714
Proc. SPIE 8495, Scattering computation for 3D laser imagery and reconstruction algorithms, 84950P (15 October 2012); doi: 10.1117/12.929135
Proc. SPIE 8495, Matrix determination of hidden object reflectance by indirect photography, 84950Q (15 October 2012); doi: 10.1117/12.929095
Measurement Instrumentation and Applications II
Proc. SPIE 8495, Measuring grazing-angle DHR with the infrared grazing angle reflectometer, 84950R (15 October 2012); doi: 10.1117/12.931512
Proc. SPIE 8495, Advanced gloss sensing for robotic applications, 84950T (15 October 2012); doi: 10.1117/12.930012
Measurement and Analysis Techniques
Proc. SPIE 8495, Sophisticated light scattering techniques from the VUV to the IR regions, 84950V (15 October 2012); doi: 10.1117/12.929923
Proc. SPIE 8495, Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system, 84950W (15 October 2012); doi: 10.1117/12.929915
Proc. SPIE 8495, Using differential ray tracing in stray light analysis, 84950X (15 October 2012); doi: 10.1117/12.946367
Proc. SPIE 8495, Optical non-contact micrometer thickness measurement system for silica thick films, 84950Y (18 October 2012); doi: 10.1117/12.929313
Measurement Instrumentation and Applications III
Proc. SPIE 8495, Extensive goniometric spectral measurements at desert sites for military engineering, 84950Z (15 October 2012); doi: 10.1117/12.930217
Proc. SPIE 8495, Optimized diffusers for reflective mirasol displays: experience from metrology characterization, 849510 (15 October 2012); doi: 10.1117/12.930189
Poster Session
Proc. SPIE 8495, Roughness evaluation of very smooth surfaces using a novel method of scatter measurement, 849512 (15 October 2012); doi: 10.1117/12.928710
Proc. SPIE 8495, Reflectance variability of surface coatings reveals characteristic eigenvalue spectra, 849514 (15 October 2012); doi: 10.1117/12.929926
Proc. SPIE 8495, Homogeneity measurements of hardness standards with a nondestructive optical method, 849517 (15 October 2012); doi: 10.1117/12.930294
Proc. SPIE 8495, A fast and accurate surface plasmon resonance system, 849518 (15 October 2012); doi: 10.1117/12.930315
Proc. SPIE 8495, Electromagnetic scattering in the open elliptic quantum billiard, 849519 (15 October 2012); doi: 10.1117/12.931588
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