A Three Component Method Of Data Analysis For Nondestructive Testing By Infrared Scanning

M. C. K. Yang; C. K. Hsieh

doi:10.1117/12.955176

15 November 1976 A Three Component Method Of Data Analysis For Nondestructive Testing By Infrared Scanning

M. C. K. Yang, C. K. Hsieh

Proceedings Volume 0095, Modern Utilization of Infrared Technology II; (1976) https://doi.org/10.1117/12.955176
Event: 20th Annual Technical Symposium, 1976, San Diego, United States

Abstract

The infrared scanning data for nondestructive testing are decomposed into three components; global trend, local contours, and noise. Methods are proposed to determine the trend function resulting from surface curvature and surface emissivity changes. The contour function is shown to possess isotherm features which permit the use of pattern recognition to detect structure defects. Data discrimination methods are also presented to identify data as to its implications. As a demonstration for application, two case studies are presented that include analysis for data without either contour or trend component.

Citation Download Citation

M. C. K. Yang and C. K. Hsieh "A Three Component Method Of Data Analysis For Nondestructive Testing By Infrared Scanning", Proc. SPIE 0095, Modern Utilization of Infrared Technology II, (15 November 1976); https://doi.org/10.1117/12.955176

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