Paper
9 November 1977 Infrared Solid State Imaging Arrays
Richard D. Nelson
Author Affiliations +
Abstract
Possible system applications of Infrared Charge Transfer Devices are reviewed. It is found that this device technology can have a very significant systems impact. Analyses are performed to calculate the quantum efficiency, quantum yield, frequency response, photoconductive gain, operating temperature, noise and the distinction between parallel and transverse bias configurations of silicon detectors. Tables of silicon detector properties are included. Approaches to the interface circuitry which couples the detectors and the CTD multiplexer are examined. Examples of existing low background and high background IRCTD detector arrays are given.
© (1977) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard D. Nelson "Infrared Solid State Imaging Arrays", Proc. SPIE 0124, Modern Utilization of Infrared Technology III, (9 November 1977); https://doi.org/10.1117/12.955847
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KEYWORDS
Sensors

Silicon

Quantum efficiency

Infrared radiation

Infrared technology

Imaging arrays

Solid state electronics

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