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29 October 1981 On Precision In The Determination Of Spectral Parameters From Condensed Phase Spectra
D. G. Cameron, D. J. Moffatt, H. H. Mantsch, J. K. Kauppinen
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Proceedings Volume 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy; (1981) https://doi.org/10.1117/12.932186
Event: 1981 International Conference on Fourier Transform Infrared Spectroscopy, 1981, Columbia, United States
Abstract
The frequency scale of commercial FT-IR instruments is precise to within ≤ 0.005 cm-1, regardless of the resolution employed in the measurement. Consequently, given adequate S/N ratios, frequencies and bandwidths of spectral lines can be determined down to this limit, provided the data are treated correctly. Although appropriate techniques are routinely utilized in high resolution gas phase studies they are not generally employed in studies of relatively low resolution (0.5-8 cm-1) condensed phase spectra. A comparison will be made of several different methods of data reduction, and it will be demonstrated that frequencies and bandwidths can be routinely determined with uncertainties of less than 0.1 cm-1, even with low instrumental resolutions. This permits the monitoring of extremely small changes in condensed phase spectra.
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D. G. Cameron, D. J. Moffatt, H. H. Mantsch, and J. K. Kauppinen "On Precision In The Determination Of Spectral Parameters From Condensed Phase Spectra", Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); https://doi.org/10.1117/12.932186
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KEYWORDS
FT-IR spectroscopy
Chemistry
Physics
Fourier transforms
Spectral resolution
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