Microcomputer Controlled Optical Scanner For Solar Cell Diagnostics

V. Dutta; O. S . Sastry; K . L. Chopra

doi:10.1117/12.936305

1 December 1983 Microcomputer Controlled Optical Scanner For Solar Cell Diagnostics

V. Dutta, O. S . Sastry, K . L. Chopra

Proceedings Volume 0428, Optical Materials and Process Technology for Energy Efficiency and Solar Applications; (1983) https://doi.org/10.1117/12.936305
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

An optical scanner for on-line analysis of defects in solar cells is described. A micro-computer is used to scan a He-Ne laser spot (5 to 25 pm diameter) over the solar cell in both X and Y directions. It also acquires 'Sc or Voc signal at each point in the area scanned and presents a map on an oscilloscope/X-Y recorder. For detailed analysis of a defective region, a fine scan is made and such cell parameters as recombination velocity and diffusion length around the defect region are calculated. The scanner has been used to study the spatial variations in the performance of single crystal and polycrystalline Si solar cells and thin film CdS/Cu₂S solar cells.

Citation Download Citation

V. Dutta, O. S . Sastry, and K . L. Chopra "Microcomputer Controlled Optical Scanner For Solar Cell Diagnostics", Proc. SPIE 0428, Optical Materials and Process Technology for Energy Efficiency and Solar Applications, (1 December 1983); https://doi.org/10.1117/12.936305

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