Paper
1 May 1986 The Pan-Imager
L. J. M. Esser, L. G. M Heldens, L. J. van de Polder, H. C. G. M. van Kuijk, H. L. Peek, G. T. J. van Gaal-Vandormael, C. A. M. Jaspers
Author Affiliations +
Proceedings Volume 0591, Solid-State Imagers and Their Applications; (1986) https://doi.org/10.1117/12.952079
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
The concept of a new type of CCD-imager is presented that uses both electrons and holes as information carriers. The device contains two separately operating p- and n-type imagers and is called PAN-imager. The p- and n-type pixels are situated in an interdot structure. Furthermore the total number of pixels as well as the number of signal charges is doubled without an increase in area. By this an improvement in resolution, light sensitivity and Moire suppression is obtained. Moreover it yields an improved contour correction. Concept, operation and properties of the PAN-imager are discussed.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. J. M. Esser, L. G. M Heldens, L. J. van de Polder, H. C. G. M. van Kuijk, H. L. Peek, G. T. J. van Gaal-Vandormael, and C. A. M. Jaspers "The Pan-Imager", Proc. SPIE 0591, Solid-State Imagers and Their Applications, (1 May 1986); https://doi.org/10.1117/12.952079
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Cited by 3 scholarly publications.
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KEYWORDS
Imaging systems

Electrons

Sensors

CCD cameras

Solid state physics

Signal processing

Moire patterns

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