Analytical tools for point source interferometry

Gregory W. Hoth; Bruno Pelle; John Kitching; Elizabeth A. Donley

doi:10.1117/12.2247688

20 February 2017 Analytical tools for point source interferometry

Gregory W. Hoth, Bruno Pelle, John Kitching, Elizabeth A. Donley

Proceedings Volume 10119, Slow Light, Fast Light, and Opto-Atomic Precision Metrology X; 1011908 (2017) https://doi.org/10.1117/12.2247688
Event: SPIE OPTO, 2017, San Francisco, California, United States

Abstract

Light pulse atom interferometry can be used to realize high-performance sensors of accelerations and rotations. In order to broaden the range of applications of these sensors, it is desirable to reduce their size and complexity. Point source interferometry (PSI) is a promising technique for accomplishing both of these goals. With PSI, rotations are measured by detecting the orientation and frequency of spatial fringe patterns in the atomic state. These spatial fringes are primarily due to a correlation between an atom's initial velocity and its final position, which is created by the expansion of a cold atom cloud. However, the fringe patterns are also influenced by the structure of the initial atomic distribution. We summarize several methods that can be used to investigate the relationship between the spatial fringe pattern and the initial atomic distribution. This relationship will need to be understood in detail to realize an accurate gyroscope based on PSI.

Citation Download Citation

Gregory W. Hoth, Bruno Pelle, John Kitching, and Elizabeth A. Donley "Analytical tools for point source interferometry", Proc. SPIE 10119, Slow Light, Fast Light, and Opto-Atomic Precision Metrology X, 1011908 (20 February 2017); https://doi.org/10.1117/12.2247688

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