Paper
19 October 2016 Controlling software development of CW terahertz target scattering properties measurements based on LabVIEW
Chang-Kun Fan, Qi Li, Yi Zhou, Yong-Peng Zhao, De-Ying Chen
Author Affiliations +
Proceedings Volume 10153, Advanced Laser Manufacturing Technology; 101530P (2016) https://doi.org/10.1117/12.2246614
Event: International Symposium on Optoelectronic Technology and Application 2016, 2016, Beijing, China
Abstract
With the development of terahertz technology and increasing studies on terahertz target scattering properties, research on terahertz target scattering properties measurements attracts more and more attention. In this paper, to solve problems in the detection process, we design a controlling software for Continuous-Wave (CW) terahertz target scattering properties measurements. The software is designed and programmed based on LabVIEW. The software controls the whole system, involving the switch between the target and the calibration target, the rotation of target, collection, display and storage of the initial data and display, storage of the data after the calibration process. The experimental results show that the software can accomplish the expected requirement, enhance the speed of scattering properties measurements and reduce operation errors.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chang-Kun Fan, Qi Li, Yi Zhou, Yong-Peng Zhao, and De-Ying Chen "Controlling software development of CW terahertz target scattering properties measurements based on LabVIEW", Proc. SPIE 10153, Advanced Laser Manufacturing Technology, 101530P (19 October 2016); https://doi.org/10.1117/12.2246614
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KEYWORDS
Process control

Scatter measurement

Scattering

Backscatter

LabVIEW

Software development

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