A turn-key calibration roadmap for temperature and radiance from 0.3-14um

Joe Jablonski; Chris Durell; Joe LaVeigne; D. Fred King

doi:10.1117/12.2262297

3 May 2017 A turn-key calibration roadmap for temperature and radiance from 0.3-14μm

Joe Jablonski, Chris Durell, Joe LaVeigne, D. Fred King

Proceedings Volume 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII; 1017804 (2017) https://doi.org/10.1117/12.2262297
Event: SPIE Defense + Security, 2017, Anaheim, CA, United States

Abstract

Many existing and emerging remote sensing applications in the UV, Visible, NIR, SWIR, MWIR and LWIR regions are challenging the conventional thinking of radiance and temperature calibration techniques. While the relationship between blackbody temperature and optical radiation is well understood, often there is an “invisible” dividing line between treatments of these values as either optical radiance or temperature. It is difficult to perform seamless temperature and radiance calibrations across the point of 2.5um. Spectrum above 2.5um is typically related in temperature terms and below 2.5um may be either spoken of in terms of temperature or optical radiance. There is also a natural unit “convergence” issue at 2.5um, due to the crossover of significant levels of emissivity, reflectance and temperature at this point. NMI traceability in the spectral region of 2.5-14.0um can also be a problem especially for spectral radiance. This paper will outline a possible turn-key test bench solution that provides traceable solutions for both temperature and radiance value in these regimes. The intent of this paper is to offer a possible solution and challenge the infrastructure that exists today over the 0.3-14um range in order to obtain a valid spectral radiance or temperature value, or both, to support emerging sensor fusion technology.

Conference Presentation

Citation Download Citation

Joe Jablonski, Chris Durell, Joe LaVeigne, and D. Fred King "A turn-key calibration roadmap for temperature and radiance from 0.3-14μm", Proc. SPIE 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII, 1017804 (3 May 2017); https://doi.org/10.1117/12.2262297

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