Paper
8 September 1993 Reliability of long wavelength lasers and photodetectors
N. K. Dutta, Doyle T. Nichols, P. Parayanthal
Author Affiliations +
Proceedings Volume 10272, Fiber Optics Reliability and Testing: A Critical Review; 102720A (1993) https://doi.org/10.1117/12.181378
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
The fabrication, performance characteristics and reliability results of InGaAsP semiconductor lasers and photodiodes are described. Our results show that the lasers exhibit excellent light emitting lifetime and spectral stability and photodiodes exhibit excellent stability in dark current and responsivity for commercial lightwave system application.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. K. Dutta, Doyle T. Nichols, and P. Parayanthal "Reliability of long wavelength lasers and photodetectors", Proc. SPIE 10272, Fiber Optics Reliability and Testing: A Critical Review, 102720A (8 September 1993); https://doi.org/10.1117/12.181378
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KEYWORDS
Reliability

Photodiodes

Semiconductor lasers

Laser stabilization

Semiconducting wafers

Laser damage threshold

Photodetectors

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