Integrated control system environment for high-throughput tomography

Igor Khokhriakov; Lars Lottermoser; Felix Beckmann

doi:10.1117/12.2275863

11 October 2017 Integrated control system environment for high-throughput tomography

Igor Khokhriakov, Lars Lottermoser, Felix Beckmann

Proceedings Volume 10391, Developments in X-Ray Tomography XI; 103911H (2017) https://doi.org/10.1117/12.2275863
Event: SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

Abstract

The extensive progress in hardware in recent years makes it now possible to develop nearly real time control system for tomography experiments. Such system can perform all the routines that are necessary for the experiment and provide real time feedback to the user. This feedback can be used for instant monitoring and/or for real time reconstruction. The initial design and implementation of such system was presented in the SPIE publication in 2014 [1]. In this paper an update to the system is presented. The paper will cover the following 4 topics. The first topic simply gives an overview of the system. The second topic presents the way how we integrate different software components to achieve simplicity and flexibility. As it is still in research and design phase we need a possibility to easily adjust the system to our needs introducing new components or removing old ones. The third topic presents a hardware driven tomography experiment design implemented at one of our beamlines. The basic idea is that a hardware signal is sent to the instrument hardware (camera, shutter etc). This signal is emitted by the controller of the sample axis which defines the moment when the system is ready to capture the next image i.e. next rotation angle. Finally as our software is in a constant process of evaluation a continuous integration process was implemented to reduce the time cost of redeployment and configuration of new versions.

Citation Download Citation

Igor Khokhriakov, Lars Lottermoser, and Felix Beckmann "Integrated control system environment for high-throughput tomography", Proc. SPIE 10391, Developments in X-Ray Tomography XI, 103911H (11 October 2017); https://doi.org/10.1117/12.2275863

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KEYWORDS

Control systems

Tomography

Cameras

Sensors

Data acquisition

Camera shutters

Data storage servers

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