Diagram method for resolution limit calculation in laser microscopy

N. Fukutake

doi:10.1117/12.2287088

20 February 2018 Diagram method for resolution limit calculation in laser microscopy

N. Fukutake

Proceedings Volume 10500, Single Molecule Spectroscopy and Superresolution Imaging XI; 105000U (2018) https://doi.org/10.1117/12.2287088
Event: SPIE BiOS, 2018, San Francisco, California, United States

Abstract

In this work, we study the influence of optical process on the resolution limit of laser microscopy. We formulate the calculation rules of the resolution limits for all types of laser microscopy that employ a variety of optical processes occurring in a sample. By replacing the field with the creation/annihilation operators, we develop a theoretical framework to unify the image-forming formulas that cover all interactions between molecules in the sample and the excitation light including vacuum field. To determine the simple rules for the evaluation of optical resolution, our theoretical framework provides the diagram method that describes linear, nonlinear, coherent, and incoherent optical processes. According to our formulas, the type of optical process decisively influences the resolution limit if no a priori information on the sample exists.

Citation Download Citation

N. Fukutake "Diagram method for resolution limit calculation in laser microscopy", Proc. SPIE 10500, Single Molecule Spectroscopy and Superresolution Imaging XI, 105000U (20 February 2018); https://doi.org/10.1117/12.2287088

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