Paper
11 May 2018 Thin film partial reflectors for generating contrast in millimeter wave images
Jeffrey Barber, Peter R. Smith, Lindsey Gray, Angel Yam, Joseph Greca, Kevin Yam, James C. Weatherall, Duane Karns, Barry T. Smith
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Abstract
Depth resolution and contrast (grayscale) resolution test objects have been proposed for incorporation into an ANSI standard for image quality of active millimeter wave (MMW) imagers for screening humans. A design for a depth resolution target has required the need for a thin film to generate a reflection while allowing for metal targets behind it to be visible to MMW imagers. Materials to accomplish this task have been identified, essentially acting as a millimeter wave beam splitter. Images obtained with a wide-bandwidth MMW imaging system are discussed. Additionally, by altering the resistivity of the thin film, the reflection coefficient of the film changes, allowing these films to be used as a contrast phantom for the testing of millimeter wave imaging systems. Measurements using laboratory millimeter wave systems are in good agreement with theory, and an image collected with a commercially-available MMW imaging systems is presented.
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Jeffrey Barber, Peter R. Smith, Lindsey Gray, Angel Yam, Joseph Greca, Kevin Yam, James C. Weatherall, Duane Karns, and Barry T. Smith "Thin film partial reflectors for generating contrast in millimeter wave images", Proc. SPIE 10634, Passive and Active Millimeter-Wave Imaging XXI, 106340I (11 May 2018); https://doi.org/10.1117/12.2306335
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Cited by 1 scholarly publication.
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KEYWORDS
Imaging systems

Image resolution

Reflection

Millimeter wave imaging

Extremely high frequency

Thin films

Image quality standards

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