Open Access Paper
5 October 2018 Front Matter: Volume 10750
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10750, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Reflection, Scattering, and Diffraction from Surfaces VI, edited by Leonard M. Hanssen, Proceedings of SPIE Vol. 10750 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510620711

ISBN: 9781510620728 (electronic)

Published by

SPIE

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Copyright © 2018, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/18/$18.00.

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Afzal, Muhammad Imran, 09

Airola, M. B., 0F

Babajanyan, N., 0K

Bartsch, Jonas, 0I

Berginc, Gerard, 02

Bergmann, Ralf B., 0I

Blue, J., 0C

Bourzgui, S., 0C

Cannon, Bret D., 08

Corzo-Garcia, Sofia C., 09

Côté, Eric, 0G

Danby, Tyler O., 05

Deckelmann, Maximilian, 0R

DeVetter, Brent M., 05, 08

Dissanska, Maria, 0H

Dubolazov, O. V., 0Q

Faivre, E., 0C

Fleming, John, 0E

Fontana, M. D., 0K

Gavryliak, D. S., 0Q

Gavrylyak, M. S., 0P, 0Q

Georges, G., 0C

Gold, Gerald, 0R

Griesmann, Ulf, 09

Grigas, Michelle A., 09

Grochocki, Frank, 0E

Hanson, Steen G., 0A

Helmreich, Klaus, 0R

Jakobsen, Michael Linde, 0A

Johnson, Timothy J., 05, 08

Kalms, Michael, 0I

Kampe, Thomas, 0E

Karas, Oleksandr V., 0N

Kauffmann, T., 0K

Kidder, Benjamin T., 09

Koeppel, Max, 0R

Kokanyan, E., 0K

Kokanyan, N., 0K

Leute, Jennifer, 03

LeVan, Paul, 03

Levesque, Martin P., 0H

Lomakin, Konstantin, 0R

Loring, John S., 05

Lu, Mi, 0L

Ma, J., 0F

Maksimyak, A. P., 0O

Maksimyak, P. P., 0O, 0P

Martinez-Niconoff, G., 0S

Martinez-Vara, P., 0S

McGuiggan, P., 0F

Meng, Yanli, 0L

Munoz-Lopez, J., 0S

Myers, Tanya L., 05, 08

Naik, Dinesh N., 0A

Nair, Gokul G., 0A

Navarro, Martha, 03

Nehrych, A. L., 0O

Oeck, Ashley M., 05

Pavlov, Sergei V., 0N

Pinaton, J., 0C

Prinzler, Martin H. U., 0I

Prodan, D. I., 0Q

R.V., Vinu, 0A

Radchenko, Kostiantyn O., 0M

Roussy, A., 0C

Sandilands, Luke J., 0G

Scharko, Nicole K., 05, 08

Schmauss, Bernhard, 0R

Sholota, Vladyslava V., 0N

Singh, Rakesh Kumar, 0A

Sippel, Mark, 0R

Su, Yin-Fong, 05

Thomas, M. E., 06, 0F

Tonkyn, Russell G., 05, 08

Werzinger, Stefan, 0R

Zabolotna, Natalia I., 0N

Zwinkels, Joanne C., 0G

Conference Committee

  • Program Track Chair

    • José Sasián, College of Optical Sciences, The University of Arizona (United States)

  • Conference Chair

    • Leonard M. Hanssen, National Institute of Standards and Technology (United States)

  • Conference Program Committee

    • Gérard Berginc, Thales Optronique S.A.S. (France)

    • Samuel D. Butler, Air Force Institute of Technology (United States)

    • Brian G. Hoover, Advanced Optical Technologies (United States)

    • Alexei A. Maradudin, University of California, Irvine (United States)

    • Michael A. Marciniak, Air Force Institute of Technology (United States)

    • Richard N. Pfisterer, Photon Engineering LLC (United States)

    • Hendrik Rothe, Helmut-Schmidt University (Germany)

    • Michael E. Thomas, Johns Hopkins University (United States)

    • Benjamin K. Tsai, National Institute of Standards and Technology (United States)

  • Session Chairs

    • 1 Theory and Modeling

      Michael E. Thomas, Johns Hopkins University (United States)

    • 2 Measurement Methods

      Brian G. Hoover, Advanced Optical Technologies (United States)

    • 3 Applications

      Gérard Berginc, Thales Optronique S.A.S. (France)

      Richard N. Pfisterer, Photon Engineering LLC (United States)

    • 4 Metrology and Standards

      Samuel D. Butler, Air Force Institute of Technology (United States)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10750", Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 1075001 (5 October 2018); https://doi.org/10.1117/12.2514588
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KEYWORDS
Imaging systems

Biomedical optics

Diffraction

X-ray optics

Current controlled current source

Instrument modeling

Laser scattering

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