Profile measurements for specular objects using binary-encoded patterns

Wei-Hung Su; Sih-Yue Chen

doi:10.1117/12.2323815

4 September 2018 Profile measurements for specular objects using binary-encoded patterns

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII; 1075513 (2018) https://doi.org/10.1117/12.2323815
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

A full-field method using fringe patterns to identify the profile of a specular surface is presented. A virtual image of the fringe pattern is formed by the specular surface. The specular surface deforms the image of fringe pattern. Thus, phase of the deformed fringes can be utilized to retrieve the profile of the inspected surface.

Citation Download Citation

Wei-Hung Su and Sih-Yue Chen "Profile measurements for specular objects using binary-encoded patterns", Proc. SPIE 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII, 1075513 (4 September 2018); https://doi.org/10.1117/12.2323815

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available