Presentation + Paper
5 October 2018 Terahertz emission from InGaAs with increased indium content
Author Affiliations +
Abstract
We have investigated the influence of indium content (x) increase on spectral characteristics of InxGa1-xAs photoconductor. To avoid the mismatch between crystalline parameters of InxGa1-xAs and GaAs wafer we proposed to incorporate a step-graded metamorphic buffer layer. We showed that x increase strongly enhances THz emission and broadens THz spectrum of InxGa1-xAs. Since no polarity rehearsal of the THz waveform occurs and electron diffusion mobility increases up to 90% with x increase we attribute the increase of THz intensity to photo-Dember effect contribution. The maximum efficiency of optical-to-THz conversion was obtained for In0.72Ga0.28 As at optical fluence ~0.01 μJ=cm2. The fabricated photoconductors can be used as promising photo-Dember or lateral photo-Dember THz emitters in pulsed THz spectroscopy and imaging, in particular, operating with long wave optical pump.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. E. Yachmenev, R. A. Khabibullin, I. E. Ilyakov, I. A. Glinskiy, A. S. Kucheryavenko, B. V. Shishkin, R. A. Akhmedzhanov, K. I. Zaytsev, and D. S. Ponomarev "Terahertz emission from InGaAs with increased indium content", Proc. SPIE 10800, Millimetre Wave and Terahertz Sensors and Technology XI, 108000D (5 October 2018); https://doi.org/10.1117/12.2322536
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Terahertz radiation

Gallium

Indium

Arsenic

Gallium arsenide

Photoresistors

Imaging spectroscopy

Back to Top