A spectral calibration approach for snapshot Image Mapping Spectrometer (IMS)

Zhenyi Ai; Yan Yuan; Lijuan Su; Xiaoming Ding; Wanyue Wang

doi:10.1117/12.2504944

18 January 2019 A spectral calibration approach for snapshot Image Mapping Spectrometer (IMS)

Zhenyi Ai, Yan Yuan, Lijuan Su, Xiaoming Ding, Wanyue Wang

Proceedings Volume 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 108390M (2019) https://doi.org/10.1117/12.2504944
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China

Abstract

The snapshot image mapping spectrometer (IMS) is a hyper-spectral imaging system that simultaneously captures spatial and spectral information about an object in a single integral time. The spectral calibration can help to obtain accurate 3D datacube of the objects. This paper proposes a new approach to improve the spectral calibration accuracy of the instrument. By adding a slit mask into the optical path to reduce crosstalk, the accuracy of each sub pupil center and spectral channel location can be improved. The calibration process is simulated to analyze the effects of the size and position designed for the mask. The analysis results show that the calibration accuracy of each sub pupil center position and spectral channel position for IMS is 3μm, which is significantly improved than the calibration accuracy 10.5μm without the mask.

Citation Download Citation

Zhenyi Ai, Yan Yuan, Lijuan Su, Xiaoming Ding, and Wanyue Wang "A spectral calibration approach for snapshot Image Mapping Spectrometer (IMS)", Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108390M (18 January 2019); https://doi.org/10.1117/12.2504944

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