Paper
18 January 2019 The angular measurement of the motion direction of the stack motion platform based on the dual-frequency laser interferometer
Author Affiliations +
Proceedings Volume 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 108390X (2019) https://doi.org/10.1117/12.2505151
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China
Abstract
In an aberration measurement for the lithographic projection lens based on the lateral shear interferometry, stage needs move tens of nanometers to do phase motion, and move tens of millimeters to shift field points. But the stage met the both requirements is very expensive. Usually using a fine stage fold on a coarse stage to meet the both requirements. Whereas this method has a difficult to overcome since the both stages hardly keep the same motion direction. This article proposes a method to measure the angle between the stages motion direction based on the dual-frequency laser interferometer by respectively moving the both stages and flowing the 45 degrees. The measurement accuracy able reach the 0.10 mrad and meet the aberration measurement requirement.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guanghua Yang, Yuejing Qi, Yu Wang, Zengxiong Lu, Jiani Su, Wei Qi, and Bing Li "The angular measurement of the motion direction of the stack motion platform based on the dual-frequency laser interferometer", Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108390X (18 January 2019); https://doi.org/10.1117/12.2505151
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KEYWORDS
Interferometers

Motion measurement

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