Detection of specular surface defects with eliminating dusts based on polarized structured-light illumination

Yiping Song; Huimin Yue; Zheng Zhou; Yiyang Huang; Yuyao Fang; Yong Liu

doi:10.1117/12.2506702

18 January 2019 Detection of specular surface defects with eliminating dusts based on polarized structured-light illumination

Yiping Song, Huimin Yue, Zheng Zhou, Yiyang Huang, Yuyao Fang, Yong Liu

Author Affiliations +

Proceedings Volume 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 108391L (2019) https://doi.org/10.1117/12.2506702
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China

Abstract

The detection of defects is one of the most crucial aspects of the manufacturing industry. There are many methods in the aspects of defects detection on the specular surface. However, in some cases, the detection results may be disturbed by the dusts on the specular surface. In this paper, a method which is based on the polarized structured-light illumination is proposed to detect the defects of specular surface with eliminating dusts. A linear polarizer is added to the structuredlight illumination system, and by controlling the polarization direction of the polarizer the dusts can be detected separately and removed in the end. Experiment results proved the effectiveness of the proposed method.

Citation Download Citation

Yiping Song, Huimin Yue, Zheng Zhou, Yiyang Huang, Yuyao Fang, and Yong Liu "Detection of specular surface defects with eliminating dusts based on polarized structured-light illumination", Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108391L (18 January 2019); https://doi.org/10.1117/12.2506702

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