Testing IR Detectors With An Expert System

Paul Norton; Judy Slager; John Stannard

doi:10.1117/12.960673

25 September 1989 Testing IR Detectors With An Expert System

Paul Norton, Judy Slager, John Stannard

Proceedings Volume 1108, Test and Evaluation of Infrared Detectors and Arrays; (1989) https://doi.org/10.1117/12.960673
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

An expert system has been developed to assist in analyzing IR detector test data. This data is taken in the production of Common Module detector-dewar assemblies. These assemblies contain on the order of 1500 internal electrical connections, and test data may consist of more than 1500 data items. Testing is done at several stages in the manufacturing sequence to determine if any rework is needed prior to the next assembly operation. Rework of a defect should be done at the earliest possible stage to minimize cost and jeopardy to the unit. Thus it is important to identify defects from their signature in the test data with consistency and accuracy. Coldfinger is the name of the expert system designed to help in this task. It was written in PROLOG and implemented on a Macintosh PC. The user friendly interface of the Macintosh made factory training easier and faster. Coldfinger's software code contains 165 facts, 348 tools and 138 rules. The facts describe the electric wiring topology and adjacency of connections, including probabilities for shorts between any two wires. The tools are used to compare test data results locally and globally. The rules have been distilled from the experience of real production personnel familiar with the product. Coldfinger operates in real time, taking about two minutes to analyze a set of test data with no defects, and only seven minutes with a hypothetical data set containing a large number of defects. Unlike real experts, Coldfinger does not eat or sleep so that assistance in decision making is available around the clock.

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Paul Norton, Judy Slager, and John Stannard "Testing IR Detectors With An Expert System", Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); https://doi.org/10.1117/12.960673

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KEYWORDS

Infrared detectors

Sensors

Manufacturing

Resistance

Diagnostics

Diagnostic tests

Analytical research

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