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17 September 2019 Regression-based sinogram replacement for CT metal artifact reduction
Seemeen Karimi, Harry Martz
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Proceedings Volume 11113, Developments in X-Ray Tomography XII; 1111309 (2019) https://doi.org/10.1117/12.2531682
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States
Abstract
In x-ray computed tomography (CT) scanning, the presence of metal objects gives rise to artifacts. Although dual-energy CT scanning and decomposition can reduce metal artifacts, in practice, the decomposition is unstable in the presence of noise and yields residual and new artifacts. A common practice in metal artifact reduction (MAR) algorithms is to use a prior-image as a guide to estimating the underlying data that are corrupted by the metal. We have developed a method in which one prior-image can be used to correct the various sinograms generated by dual-energy decomposition. We applied our method to data acquired on a commercial CT scanner. Compared to the uncorrected images, the MAR images have superior uniformity in known uniform regions while preserving edges, and better visual definition of structures.
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Seemeen Karimi and Harry Martz "Regression-based sinogram replacement for CT metal artifact reduction", Proc. SPIE 11113, Developments in X-Ray Tomography XII, 1111309 (17 September 2019); https://doi.org/10.1117/12.2531682
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KEYWORDS
Metals
X-ray computed tomography
Computer security
Computing systems
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