Status of the next generation CMOS-TDI detector for high-resolution imaging

Andreas Eckardt; Stefan Glaesener; Ralf Reulke; Karsten Sengebusch; Bernd Zender

doi:10.1117/12.2528698

9 September 2019 Status of the next generation CMOS-TDI detector for high-resolution imaging

Andreas Eckardt, Stefan Glaesener, Ralf Reulke, Karsten Sengebusch, Bernd Zender

Proceedings Volume 11127, Earth Observing Systems XXIV; 111270J (2019) https://doi.org/10.1117/12.2528698
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 35 years of experience with high-resolution imaging technology. This paper shows the institutes scientific results of the next generation of CMOS detector design in a TDI (Time Delay and Integration) architecture. This project includes the technological design of future high or multispectral resolution space-borne instruments and the possibility of higher integration. First results where published by Eckardt, et al. (1 ) 2013 and (2 ) 2014. DLR OS and the Fraunhofer Institute for Microelectronic Circuits and Systems in Duisburg were driving the technology of new detectors for future high resolution projects and hybridization capability in order to keep pace with the ambitious scientific and user requirements. In combination with the engineering research, the current generation of space borne sensor systems is focusing on VIS/NIR high spectral resolution to meet the requirements on earth and planetary observation systems. The combination of large swath and high-spectral resolution with intelligent synchronization control, fast-readout ADC chains and new focal-plane concepts open the door to new remote-sensing and smart deep-space instruments. The paper gives an overview over the DLR detector development and verification program on FPA level. New control possibilities for CMOS-TDI NGdetectors in synchronization control mode, and key parameters like linearity, PTC, cross talk and control effort will be discussed in detail.

Conference Presentation

Citation Download Citation

Andreas Eckardt, Stefan Glaesener, Ralf Reulke, Karsten Sengebusch, and Bernd Zender "Status of the next generation CMOS-TDI detector for high-resolution imaging", Proc. SPIE 11127, Earth Observing Systems XXIV, 111270J (9 September 2019); https://doi.org/10.1117/12.2528698

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