Paper
7 October 2019 Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems
Author Affiliations +
Proceedings Volume 11161, Technologies for Optical Countermeasures XVI; 111610A (2019) https://doi.org/10.1117/12.2533142
Event: SPIE Security + Defence, 2019, Strasbourg, France
Abstract
Based on our previous work1, we further investigate the laser-induced damage effects on digital micromirror devices (DMD) in comparison to different electro-optical imaging sensors such as complementary metal-oxide-semiconductors (CMOS) and charge-coupled devices (CCD). In our earlier work, we reported on damage thresholds obtained by pulsed laser radiation of nanosecond pulse width and by continuous-wave laser radiation utilizing irradiation times ranging from 250 milliseconds up to 10 seconds. The main objective of our current work is to fill the gap regarding the time scale of picosecond pulses. In the course of this research, we enhanced the experimental setup and we explicitly describe the achieved improvements in this work. Furthermore, we characterize the damage caused by laser pulse energies exceeding the laser-induced damage threshold (LIDT).
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Bastian Schwarz, Michael Koerber, Gunnar Ritt, and Bernd Eberle "Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems", Proc. SPIE 11161, Technologies for Optical Countermeasures XVI, 111610A (7 October 2019); https://doi.org/10.1117/12.2533142
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KEYWORDS
Sensors

Cameras

Laser damage threshold

Laser induced damage

Imaging systems

Pulsed laser operation

CCD image sensors

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