Applications in optical quantum metrology (Conference Presentation)

Thomas Gerrits

doi:10.1117/12.2552687

27 March 2020 Applications in optical quantum metrology (Conference Presentation)

Thomas Gerrits

Proceedings Volume 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II; 1129612 (2020) https://doi.org/10.1117/12.2552687
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

"Applications in optical quantum metrology" was recorded at Photonics West 2020 in San Francisco, California.

Conference Presentation

Citation Download Citation

Thomas Gerrits "Applications in optical quantum metrology (Conference Presentation)", Proc. SPIE 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II, 1129612 (27 March 2020); https://doi.org/10.1117/12.2552687

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available