PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Very recently high quality MISFET devices have been fabricated using native In(PO3)3-like condensed phosphates. It is believed that the high performance obtained is related to the particular physicochemical and structural properties of these phosphates. They exhibit good intrinsic dielectric properties (resistivity : 10 13 Ω.cm, bandgap ~6.8 eV). A high degree of structural flexibility favors crystallo-chemical matching between the semiconductor and the oxide. Growth of these native oxides leads to a buried interface with a relatively smooth oxide/semiconductor interface (roughness of about 20 Å).
J. Joseph,Y. Robach,G. Hollinger,P. Ferret, andM. Pitaval
"The Passivation Of InP by In (PO3)3 Condensed Phosphates for MISFET Applications", Proc. SPIE 1144, 1st Intl Conf on Indium Phosphide and Related Materials for Advanced Electronic and Optical Devices, (28 November 1989); https://doi.org/10.1117/12.962010
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
J. Joseph, Y. Robach, G. Hollinger, P. Ferret, M. Pitaval, "The Passivation Of InP By In (PO3)3 Condensed Phosphates For MISFET Applications," Proc. SPIE 1144, 1st Intl Conf on Indium Phosphide and Related Materials for Advanced Electronic and Optical Devices, (28 November 1989); https://doi.org/10.1117/12.962010