FT-IR Emission Spectroscopy As A Tool For Studying Thin Films And Thermal Changes In Samples

Senja V. Compton; Jay R. Powell; David A.C. Compton

doi:10.1117/12.969462

1 December 1989 FT-IR Emission Spectroscopy As A Tool For Studying Thin Films And Thermal Changes In Samples

Senja V. Compton, Jay R. Powell, David A.C. Compton

Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969462
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States

Abstract

Infrared emission spectroscopy has been used routinely to study samples at high temperatures, such as rocket plumes. The designs of modern FT-IR instruments and a new emission accessory having high optical throughput, now allow the observation of emission spectra at much lower temperatures than previously. This greatly enhanced sensitivity to emission energy can be used routinely to either record spectra at room temperature, or obtain information about very thin films.

Citation Download Citation

Senja V. Compton, Jay R. Powell, and David A.C. Compton "FT-IR Emission Spectroscopy As A Tool For Studying Thin Films And Thermal Changes In Samples", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969462

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