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An Èchelle-grating specifically developed for the space borne measurement of earth’s atmospheric CO2-concentration is presented. It has a line density of ~170L/mm and is manufactured on a thick crystalline silicon substrate using electron beam lithography. The echelle profile is realized using a highly anisotropic chemical etching process, which stops on the <111> crystallographic planes of the crystal. The established manufacturing process allows perfect linear grating facets with negligible corner rounding of the profile. The important property of showing a low polarization sensitivity of the diffraction efficiency is achieved by a special design and technology for applying the gold coating of the grating which intentionally leaves one grating facet uncoated.
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Susann Sadlowski, Torsten Harzendorf, Stefan Schwinde, Frank Burmeister, Dirk Michaelis, Thomas Flügel-Paul, Uwe Zeitner, "Échelle grating with improved polarization characteristics used for Earth observation," Proc. SPIE 11451, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, 114511D (13 December 2020); https://doi.org/10.1117/12.2562546