Poster + Paper
10 October 2020 Study of thin bismuth-based films using terahertz time-domain polarimetry
Author Affiliations +
Conference Poster
Abstract
Recent years, polarimetry in the terahertz frequency range has gained popularity. Polarimetry is a technique used to measure the polarization state of electromagnetic waves transmitted through samples. The ellipticity angle, the azimuth rotation angle, complex optical properties of materials can be obtained by terahertz timedomain polarimetry. This allows for obtaining more comprehensive information about the object. In this paper, we study diagonal and off-diagonal components of the permittivity tensor of thin bismuth-based films using terahertz time-domain polarimetry
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anna V. Kuzikova, Mikhail G. Novoselov, Anna V. Vozianova, Dmitry V. Zykov, Elena S. Makarova, Natallya S. Kablukova, and Mikhail K. Khodzitsky "Study of thin bismuth-based films using terahertz time-domain polarimetry", Proc. SPIE 11559, Infrared, Millimeter-Wave, and Terahertz Technologies VII, 1155918 (10 October 2020); https://doi.org/10.1117/12.2575393
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polarimetry

Thin films

Terahertz radiation

Polarization

Applied research

Electromagnetic scattering

Medical diagnostics

Back to Top