Paper
5 November 2020 Rapid determination of spectral directional emissivity of infrared stealth materials at high temperature with laser heating
Chao Qiu, Hongsheng Sun, Jiapeng Wang, Yuguo Zhang, Qingzheng Cao
Author Affiliations +
Proceedings Volume 11563, AOPC 2020: Infrared Device and Infrared Technology; 115630R (2020) https://doi.org/10.1117/12.2581222
Event: Applied Optics and Photonics China (AOPC 2020), 2020, Beijing, China
Abstract
A novel laser heating method to heat specimen rapidly and uniformly to1800K in spectral directional emissivity of infrared stealth materials measurement is proposed, and a measurement system is developed based on this method. The measurement system is mainly composed of a laser heating device, a specimen heating bin, a reference blackbody, and a infrared spectrum radiation detecting device. The spectral directional emissivities of one kind of aluminum alloy specimen at room temperature and high temperature are measured using the measurement system, every measurement is completed in 3 minutes. The results indicate that spectral directional emissivity of infrared stealth materials at high temperature can be measured using the measurement system rapidly and accurately.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chao Qiu, Hongsheng Sun, Jiapeng Wang, Yuguo Zhang, and Qingzheng Cao "Rapid determination of spectral directional emissivity of infrared stealth materials at high temperature with laser heating", Proc. SPIE 11563, AOPC 2020: Infrared Device and Infrared Technology, 115630R (5 November 2020); https://doi.org/10.1117/12.2581222
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KEYWORDS
Infrared radiation

Black bodies

Infrared materials

Temperature metrology

Thermography

Infrared detectors

Reflectivity

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