CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11649 > Article
Poster + Presentation + Paper
5 March 2021 Robust gaussian fitting for super-resolution microscopy with fast parameters initial estimation
Shun Qin, Wai Kin Chan
Author Affiliations +
Proceedings Volume 11649, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVIII; 116491A (2021) https://doi.org/10.1117/12.2583387
Event: SPIE BiOS, 2021, Online Only
Conference Poster
Abstract
Efficient accurate Gaussian fitting is an important topic in many applications, take localization based super-resolution microscopy and image scanning microscopy for example, which requires localizing plenty of Gaussian patterns for accurately reconstructing a super-resolution image. Existing Gaussian fitting methods usually require inputting a good initial value for all parameters for efficient and robust fitting, which apparently is not suitable for the task of large scale Gaussian fitting with a computer. It would be even more challenge to estimate an appropriate initial value for all parameters and guarantee the robustness of the fitting algorithm for low signal-to-noise ratio measured data with strong background. In this paper, we propose a two-step fitting algorithm for robust and accurate 2D Gaussian fitting without inputting any initial parameter value. Our simulation shows that the performance of the fitting algorithm can be improved significantly with the proposed parameter initial value estimation algorithm.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Shun Qin and Wai Kin Chan "Robust gaussian fitting for super-resolution microscopy with fast parameters initial estimation", Proc. SPIE 11649, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVIII, 116491A (5 March 2021); https://doi.org/10.1117/12.2583387
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 7 PAGES + POSTER + PRESENTATION
DOWNLOAD PAPER SAVE TO MY LIBRARY
DOWNLOAD
POSTER
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Super resolution microscopy
Computer simulations
Microscopy
Signal to noise ratio
Super resolution
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top