Paper
16 July 2021 Synthetic training data generation for deep learning based quality inspection
Pierre Gutierrez, Maria Luschkova, Antoine Cordier, Mustafa Shukor, Mona Schappert, Tim Dahmen
Author Affiliations +
Proceedings Volume 11794, Fifteenth International Conference on Quality Control by Artificial Vision; 1179403 (2021) https://doi.org/10.1117/12.2586824
Event: Fifteenth International Conference on Quality Control by Artificial Vision, 2021, Tokushima, Japan
Abstract
Deep learning is now the gold standard in computer vision-based quality inspection systems. In order to detect defects, supervised learning is often utilized, but necessitates a large amount of annotated images, which can be costly: collecting, cleaning, and annotating the data is tedious and limits the speed at which a system can be deployed as everything the system must detect needs to be observed first. This can impede the inspection of rare defects, since very few samples can be collected by the manufacturer. In this work, we focus on simulations to solve this issue. We first present a generic simulation pipeline to render images of defective or healthy (non defective) parts. As metallic parts can be highly textured with small defects like holes, we design a texture scanning and generation method. We assess the quality of the generated images by training deep learning networks and by testing them on real data from a manufacturer. We demonstrate that we can achieve encouraging results on real defect detection using purely simulated data. Additionally, we are able to improve global performances by concatenating simulated and real data, showing that simulations can complement real images to boost performances. Lastly, using domain adaptation techniques helps improving slightly our final results.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Gutierrez, Maria Luschkova, Antoine Cordier, Mustafa Shukor, Mona Schappert, and Tim Dahmen "Synthetic training data generation for deep learning based quality inspection", Proc. SPIE 11794, Fifteenth International Conference on Quality Control by Artificial Vision, 1179403 (16 July 2021); https://doi.org/10.1117/12.2586824
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KEYWORDS
Inspection

Defect detection

Defect inspection

Manufacturing

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