Open Access Paper
13 October 2022 Front Matter: Volume 12240
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 12240 including the Title Page, Copywrite information, and Table of Contents.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Advances in X-Ray/EUV Optics and Components XVII, edited by Ali M. Khounsary, Hidekazu Mimura, Christian Morawe, Proc. of SPIE 12240, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510654648

ISBN: 9781510654655 (electronic)

Published by

SPIE

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Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE).

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher.

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Publication of record for individual papers is online in the SPIE Digital Library.

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Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Program Track Chair

  • Ali Khounsary, Illinois Institute of Technology (United States))

  • Ralph James, Savannah River National Laboratory (United States)

Conference Chairs

  • Ali M. Khounsary, Illinois Institute of Technology (United States)

  • Hidekazu Mimura, The University of Tokyo (Japan)

  • Christian Morawe, European Synchrotron Radiation Facility (France)

Conference Co-Chair

  • Daniele Spiga, INAF - Osservatorio Astronomico di Brera (Italy)

Conference Program Committee

  • Bernhard W. Adams, Research Instruments Corporation (United States)

  • Lucia Alianelli, Diamond Light Source Ltd. (United Kingdom)

  • Lahsen Assoufid, Argonne National Laboratory (United States)

  • Stefan Braun, Westsächsische Hochschule Zwickau (Germany)

  • Daniele Cocco, Lawrence Berkeley National Laboratory (United States)

  • Raymond P. Conley Jr., Argonne National Laboratory (United States)

  • Christian David, Paul Scherrer Institut (Switzerland)

  • Shunji Goto, RIKEN SPring-8 Center (Japan)

  • Hans M. Hertz, KTH Royal Institute of Technology (Sweden)

  • Yoshio Ichii, JTEC Corporation (Japan)

  • Werner H. Jark, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • George A. Kyrala, Los Alamos National Laboratory (United States)

  • Eric Louis, University of Twente (Netherlands)

  • Patrick P. Naulleau, The Center for X-Ray Optics (United States)

  • Haruhiko Ohashi, RIKEN SPring-8 Center (Japan)

  • Ladislav Pina, Czech Technical University in Prague (Czech Republic)

  • Michael J. Pivovaroff, SLAC National Accelerator Laboratory (United States)

  • Yuriy Y. Platonov, Rigaku Innovative Technologies, Inc. (United States)

  • Regina Soufli, Lawrence Livermore National Laboratory (United States)

  • Stanislav Stoupin, Cornell University (United States)

  • Mau-Tsu Tang, National Synchrotron Radiation Research Center (Taiwan)

  • Giovanni Volpe, Göteborgs Universitet (Sweden)

  • Zhanshan Wang, Tongji University (China)

  • Makina Yabashi, RIKEN SPring-8 Center (Japan)

  • Kazuto Yamauchi, Osaka University (Japan)

  • Brian W. Yates, Canadian Light Source Inc. (Canada)

© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 12240", Proc. SPIE 12240, Advances in X-Ray/EUV Optics and Components XVII, 1224001 (13 October 2022); https://doi.org/10.1117/12.2661680
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KEYWORDS
X-ray microscopy

X-ray optics

X-ray fluorescence spectroscopy

X-ray imaging

Synchrotron x-ray imaging

X-ray astronomy

X-ray diffraction

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