Study on internal defects of insulating materials by terahertz time-domain spectroscopic imaging technology

Weiwei Chi; Haifeng Liu; Zhilei Li; Limei Zhou; Zhihui Jia; Fang Xie

doi:10.1117/12.2648772

14 October 2022 Study on internal defects of insulating materials by terahertz time-domain spectroscopic imaging technology

Weiwei Chi, Haifeng Liu, Zhilei Li, Limei Zhou, Zhihui Jia, Fang Xie

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Proceedings Volume 12343, 2nd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2022); 1234333 (2022) https://doi.org/10.1117/12.2648772
Event: 2nd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2022), 2022, Qingdao, China

Abstract

Terahertz waves not only have the advantages of good penetration, low attenuation, strong collimation in the propagation through insulating dielectric materials, but also have high resolution in 3D tomography imaging and visualization. It has a good application prospect in the field of defect detection of electrical equipment. Polyethylene (PE) material has excellent insulating properties, which has important applications in electricity, however, various defects will occur in the process of production, transportation, and during the usage. The common testing methods have some limitations in the nondestructive testing of polyethylene materials. THz reflection imaging was performed on the simulated polyethylene defect samples, the results proved that the internal information such as the location and shape of PE samples can be detected. Meanwhile the minimum detectable defect size is determined, and the experiment showed that the defect with a diameter of 0.8 mm can be accurately resolved, which can provide theoretical and experimental basis for detecting the internal structure.

Citation Download Citation

Weiwei Chi, Haifeng Liu, Zhilei Li, Limei Zhou, Zhihui Jia, and Fang Xie "Study on internal defects of insulating materials by terahertz time-domain spectroscopic imaging technology", Proc. SPIE 12343, 2nd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2022), 1234333 (14 October 2022); https://doi.org/10.1117/12.2648772

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KEYWORDS

Terahertz radiation

Nondestructive evaluation

Terahertz spectroscopy

Defect detection

Imaging spectroscopy

Spectroscopy

Sensors

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