Presentation + Paper
13 March 2023 Ge-on-Si waveguide device for self-referenced fingerprint region absorption spectroscopy
Author Affiliations +
Proceedings Volume 12426, Silicon Photonics XVIII; 124260I (2023) https://doi.org/10.1117/12.2650469
Event: SPIE OPTO, 2023, San Francisco, California, United States
Abstract
We present the development of Ge-on-Si waveguide-based devices for low-noise mid-infrared absorption spectroscopy of aqueous solutions, targeting wavelengths between 6 and 10 μm, that are able to reduce the relative intensity noise which is a key roadblock when measuring tiny analyte absorptions masked by a large background matrix absorption. The sensor uses a pair of integrated thermo-optic switches to continuously switch light between a reference waveguide and a sensor waveguide, so that common noise components can be cancelled out, even when the light source and photodetector are not integrated on the same chip.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Nedeljkovic, C. Stirling, D. J. Rowe, M. Banakar, Y. Qi, X. Yan, C. G. Littlejohns, and G. Z. Mashanovich "Ge-on-Si waveguide device for self-referenced fingerprint region absorption spectroscopy", Proc. SPIE 12426, Silicon Photonics XVIII, 124260I (13 March 2023); https://doi.org/10.1117/12.2650469
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KEYWORDS
Waveguides

Absorption

Sensors

Waveguide sensors

Circuit switching

Photodetectors

Relative intensity noise

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