Abstract
Starting with the spectral range of the measurement system, we show how to determine the appropriate OPD cutoff values, retarder thicknesses, and tolerances for a channeled spectropolarimetry system. While the overall thickness tolerances for the retarders can be quite loose, the tolerances of the thickness ratios between the various waveplates must be tightly maintained.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nathan Hagen "Design of channeled spectropolarimeters", Proc. SPIE 12480, Optical Technology and Measurement for Industrial Applications Conference 2022, 1248008 (8 December 2022); https://doi.org/10.1117/12.2660159
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KEYWORDS
Spectroscopy

Wave plates

Modulation

Spectral resolution

Tolerancing

Fourier transforms

Light sources

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