A novel phase extraction method based on deep learning for estimating geometric properties of optical flat

Jurim Jeon; Yangjin Kim

doi:10.1117/12.2673537

10 August 2023 A novel phase extraction method based on deep learning for estimating geometric properties of optical flat

Jurim Jeon, Yangjin Kim

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Proceedings Volume 12618, Optical Measurement Systems for Industrial Inspection XIII; 126182C (2023) https://doi.org/10.1117/12.2673537
Event: SPIE Optical Metrology, 2023, Munich, Germany

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Jurim Jeon and Yangjin Kim "A novel phase extraction method based on deep learning for estimating geometric properties of optical flat", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126182C (10 August 2023); https://doi.org/10.1117/12.2673537

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