Paper
11 August 2023 On the use of physics in machine learning for manufacturing process inspection
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Abstract
We discuss the use of machine learning in computational imaging for manufacturing process inspection and control. In a recent article we described a physics-enhanced auto-correlation based estimator (Peace) for quantitative speckle. We derived an explicit forward relationship between the Particle Size Distribution (PSD) and the speckle autocorrelation for particle sizes significantly larger than the wavelength (x100 to approximately x1,000). We subsequently trained a machine learning kernel to invert the autocorrelation and obtain the PSD, using the explicit forward model to reduce the number of experimentally acquired examples. In this talk, we present an expanded discussion of Peace and its properties, including spatial and temporal sampling and accuracy, and more general applications.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
George Barbastathis, Qihang Zhang, Ajinkya Pandit, Wenlong Tang, Charles Papageorgiou, Richard D. Braatz, Allan S. Myerson, Bingyao Tan, and Leopold Schmetterer "On the use of physics in machine learning for manufacturing process inspection", Proc. SPIE 12622, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials VI, 126220Y (11 August 2023); https://doi.org/10.1117/12.2678259
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KEYWORDS
Particles

Speckle

Autocorrelation

Computational imaging

Manufacturing

Machine learning

Scattering

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