Improved polarimetric calibration using a microcontroller-driven rotating analyzer

Amber L. Iler; David W. Kletzli Jr.; B. T. Cesul

doi:10.1117/12.2676919

3 October 2023 Improved polarimetric calibration using a microcontroller-driven rotating analyzer

Amber L. Iler, David W. Kletzli Jr., B. T. Cesul

Proceedings Volume 12690, Polarization Science and Remote Sensing XI; 126900A (2023) https://doi.org/10.1117/12.2676919
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

We outfitted a polarimetric microgrid sensor with standard c-mounted lenses and observed inconsistencies in the linear polarimetric response across the focal plane, particularly in the corners. We provide details of our polarimetric image calibration process to mitigate these inconsistencies and display processed results. Standard dark correction and gain calibration improved intensity uniformity, but polarized Mueller calibration was needed to correct variability in polarimetric response at the pixel level. We improved our Mueller calibration process through the addition of an Arduino-controlled rotating analyzer to capture uniform polarimetric scenes. This made the Mueller data collection process significantly easier, more repeatable, and resulted in improved polarimetric Stokes products. Details of the device and examples of how it improved results are shared.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Amber L. Iler, David W. Kletzli Jr., and B. T. Cesul "Improved polarimetric calibration using a microcontroller-driven rotating analyzer", Proc. SPIE 12690, Polarization Science and Remote Sensing XI, 126900A (3 October 2023); https://doi.org/10.1117/12.2676919

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