High-speed fly-scan capabilities for x-ray microscopy systems at NSLS-II

Weihe Xu; Huijuan Xu; Dmitri Gavrilov; Xiaojing Huang; Hanfei Yan; Yong S. Chu; Evgeny Nazaretski

doi:10.1117/12.2675940

5 October 2023 High-speed fly-scan capabilities for x-ray microscopy systems at NSLS-II

Weihe Xu, Huijuan Xu, Dmitri Gavrilov, Xiaojing Huang, Hanfei Yan, Yong S. Chu, Evgeny Nazaretski

Proceedings Volume 12698, X-Ray Nanoimaging: Instruments and Methods VI; 126980B (2023) https://doi.org/10.1117/12.2675940
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

We are developing a next-generation scanning x-ray microscope that will significantly enhance 3D ptychographic imaging capabilities available at NSLS-II. One of the important technical tasks pertains to providing high-speed data acquisition using fly-scanning, which may hold a significant advantage overstep scanning. The developed state-of-the-art x-ray microscope is EPICS-compatible and utilizes piezo actuators for fast raster scanning. The position is monitored by laser interferometers (or native encoders) and transferred to an FPGA-based device (Zebra box), which outputs detector trigger signals at a high frequency. The developed system is supported in a standard NSLS-II controls environment and can be implemented at existing and to-be-developed beamlines. At present, a similar fly-scanning capability is deployed at Submicron Resolution x-ray Spectroscopy (SRX) and Hard X-ray Nanoprobe (HXN) beamlines at NSLS-II.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Weihe Xu, Huijuan Xu, Dmitri Gavrilov, Xiaojing Huang, Hanfei Yan, Yong S. Chu, and Evgeny Nazaretski "High-speed fly-scan capabilities for x-ray microscopy systems at NSLS-II", Proc. SPIE 12698, X-Ray Nanoimaging: Instruments and Methods VI, 126980B (5 October 2023); https://doi.org/10.1117/12.2675940

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