The research on irregular volume measurement is based on image gray normalization method and brightness restoration method

Xiang-Xiang Luo; Wen-han Hu; Feng Li; Fei Yuan; Xia Gao; Cheng-Fang Qiao; Chun-Sheng Zhou

doi:10.1117/12.2682594

26 May 2023 The research on irregular volume measurement is based on image gray normalization method and brightness restoration method

Xiang-Xiang Luo, Wen-han Hu, Feng Li, Fei Yuan, Xia Gao, Cheng-Fang Qiao, Chun-Sheng Zhou

Author Affiliations +

Proceedings Volume 12700, International Conference on Electronic Information Engineering and Data Processing (EIEDP 2023); 127000X (2023) https://doi.org/10.1117/12.2682594
Event: International Conference on Electronic Information Engineering and Data Processing (EIEDP 2023), 2023, Nanchang, China

Abstract

For industrial CT, the existing 3D measurement method based on industrial CT sequence imaging needs to be improved in terms of accuracy, speed and the degree of automation. In this context, based on the existing imaging measurement theory and taking the industrial CT sequence imaging as the experimental object, two volume measurement methods have been proposed this paper based on the industrial CT sequence imaging. This method was applied to carry out equal spacing stratified CT scan on three typical shapes of standard steel workpiece and Actual workpiece with inner cavity, and the obtained sequence fault imaging was measured and analyzed and verified. The experimental results show that the two measurement methods proposed in this paper improve the accuracy of measurement by two to three orders of magnitude and the accuracy of measurement is better than 1% compared with the existing volume measurement algorithm, which can meet the high precision requirements of the engineering application.

Citation Download Citation

Xiang-Xiang Luo, Wen-han Hu, Feng Li, Fei Yuan, Xia Gao, Cheng-Fang Qiao, and Chun-Sheng Zhou "The research on irregular volume measurement is based on image gray normalization method and brightness restoration method", Proc. SPIE 12700, International Conference on Electronic Information Engineering and Data Processing (EIEDP 2023), 127000X (26 May 2023); https://doi.org/10.1117/12.2682594

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