Characterization of electrochromic dc-sputtered nickel-oxide-based films

Anne M. Andersson; W. Estrada; Claes-Goeran Granqvist; Annette Gorenstein; Franco Decker

doi:10.1117/12.20436

1 August 1990 Characterization of electrochromic dc-sputtered nickel-oxide-based films

Anne M. Andersson, W. Estrada, Claes-Goeran Granqvist, Annette Gorenstein, Franco Decker

Proceedings Volume 1272, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion IX; (1990) https://doi.org/10.1117/12.20436
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands

Abstract

Nonstoichiometric nickel oxide films were made by reactive dc magnetron sputtering. Subsequent electrochemical treatment in KOH established electrochromism. The material was studied by combined mechanical and optical measurements during electrochemical cycling, spectral infrared reflectance, XPS, and X-ray diffraction. Mechanical stress data showed that electrochromic bleaching was associated with proton insertion. P-polarized infrared reflectance showed OH stretching vibrations representative of "free" OH for the bleached state and OH in the presence of hydrogen bonds for the coloured state. XPS data for 01 s core level electrons indicated one binding state in the bleached material and two binding states in the coloured material. Heat-treated samples had significantly decreased electrochromism.

Citation Download Citation

Anne M. Andersson, W. Estrada, Claes-Goeran Granqvist, Annette Gorenstein, and Franco Decker "Characterization of electrochromic dc-sputtered nickel-oxide-based films", Proc. SPIE 1272, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion IX, (1 August 1990); https://doi.org/10.1117/12.20436

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