Presentation + Paper
29 November 2023 Dynamic illumination in phase-shifting interferometry
Leslie L. Deck, Nate Austin
Author Affiliations +
Proceedings Volume 12778, Optifab 2023; 127780O (2023) https://doi.org/10.1117/12.2690821
Event: SPIE Optifab, 2023, Rochester, New York, United States
Abstract
Phase-shifting interferometry is the premier measurement technique for high-precision surface form metrology. Generally, the measurement cavity is illuminated with a stationary, on-axis, point-like source of coherent light situated at the interferometer source plane. We describe how to enable a variety of useful functions to aid interferometric metrology applications by dynamically moving the source point during a phase-shifting measurement using steering mirror technology. Called Dynamic Illumination, these motions describe trajectories that often take the form of geometric primitives like points, lines, arcs, circles, and spirals. A fixed point on the optical axis represents conventional operation, but measurements using different trajectories enable different functions. We highlight three exemplary functions in this paper; phase shifting, autofocus, and coherent noise reduction techniques.
Conference Presentation
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Leslie L. Deck and Nate Austin "Dynamic illumination in phase-shifting interferometry", Proc. SPIE 12778, Optifab 2023, 127780O (29 November 2023); https://doi.org/10.1117/12.2690821
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KEYWORDS
Light sources and illumination

Mirrors

Fizeau interferometers

Optical surfaces

Phase shifts

Phase interferometry

Beam steering

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