Advancements in thin-film coating metrology

Jared Sittig

doi:10.1117/12.2683597

29 November 2023 Advancements in thin-film coating metrology

Jared Sittig

Proceedings Volume 12778, Optifab 2023; 127780U (2023) https://doi.org/10.1117/12.2683597
Event: SPIE Optifab, 2023, Rochester, New York, United States

Abstract

Tightening specifications and increasing demands for high performance optical coatings continue to drive advancements in many areas of the optical manufacturing industry. To ensure customer confidence, test and verification methods must be created to measure tighter tolerances than ever before for all aspects of thin-film quality control, including reflectance, transmittance, absorption, scatter, laser-damage threshold, lifetime stability, environmental durability, filter-edge steepness, deposition uniformity, and induced stress, to name a few. This talk will outline emerging performance requirements for optical thin films and the metrology solutions being developed to satisfy them.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Jared Sittig "Advancements in thin-film coating metrology", Proc. SPIE 12778, Optifab 2023, 127780U (29 November 2023); https://doi.org/10.1117/12.2683597

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