Poster + Paper
11 March 2024 Physical assurance for photonics devices
Liton Kumar Biswas, Nitin Varshney, Volker Sorger, Hamed Dalir, Navid Asadizanjani
Author Affiliations +
Proceedings Volume 12893, Photonic Instrumentation Engineering XI; 1289315 (2024) https://doi.org/10.1117/12.3003243
Event: SPIE OPTO, 2024, San Francisco, California, United States
Conference Poster
Abstract
Photonics’ potential has changed various industries. Device and system security is important as photonics technology advances. Physical risks and photonics asset protection are examined in this work. Post-silicon device and system integrity is tested utilizing side channel signal analysis, fault injection assessment, reverse engineering, electrical and optical probing, and photonic emission analysis. Chips, imaging, probing, electrical characterization, and spectroscopy are needed for these methods. Even with breakthroughs in failure analysis and side channel measuring devices, attackers may use these systems to attack and expose critical data, cryptographic keys, firmware, configuration passwords, and intellectual property. Physical attacks weaken encryption and security, giving unauthorized access to embedded system assets. All physical attacks and remedies are covered in this special issue on photonics assurance security. Photonics assurance research on limiting physical hazards and safeguarding photonics-based devices and systems is included in this special issue. Our actions will keep photonics technology safe and foster innovation across industries.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Liton Kumar Biswas, Nitin Varshney, Volker Sorger, Hamed Dalir, and Navid Asadizanjani "Physical assurance for photonics devices", Proc. SPIE 12893, Photonic Instrumentation Engineering XI, 1289315 (11 March 2024); https://doi.org/10.1117/12.3003243
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KEYWORDS
Silicon photonics

Silicon

Packaging

Photonics

Inspection

Information security

Manufacturing

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