Towards Cn2 parity between imaging-based simulation and measurement

Thomas Pascarella Watson; Apratim Dasgupta; Daniel Foti; Eddie L. Jacobs

doi:10.1117/12.3013902

7 June 2024 Towards Cn2 parity between imaging-based simulation and measurement

Thomas Pascarella Watson, Apratim Dasgupta, Daniel Foti, Eddie L. Jacobs

Author Affiliations +

Proceedings Volume 13045, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV; 130450I (2024) https://doi.org/10.1117/12.3013902
Event: SPIE Defense + Commercial Sensing, 2024, National Harbor, Maryland, United States

Abstract

Optical turbulence in the atmosphere causes defocus, blur, and wander of images captured over long distances, which can significantly degrade their quality. Turbulence is a manifestation of variations in the index of refraction, which are caused by local variations in air temperature, pressure, humidity, gas content, and other factors. Turbulence can be quantified by the refractive index structure function parameter C²_n. Simulation of images after propagation through an atmosphere of a specific C²_n, along with measurement of the observed C²_n from images, is thus of interest for a variety of agricultural, environmental, and defense applications. We discuss the generation of simulated imagery after propagation through an atmosphere of a defined C²_n using various algorithms, then examine methods to determine the observed C²_n from the generated images. Finally, we choose and test an algorithm to generate images and another to estimate C²_n, then compare and contrast the observed C²_n to the defined C²_n in each case to observe how the simulation method and measurement method perform.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Thomas Pascarella Watson, Apratim Dasgupta, Daniel Foti, and Eddie L. Jacobs "Towards Cn2 parity between imaging-based simulation and measurement", Proc. SPIE 13045, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV, 130450I (7 June 2024); https://doi.org/10.1117/12.3013902

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE