Presentation + Paper
23 August 2024 Tracking radiation damage of Euclid VIS detectors after one year in space
Author Affiliations +
Abstract
Due to the space radiation environment at L2, ESA’s Euclid mission will be subject to a large amount of highly energetic particles over its lifetime. These particles can cause damage to the detectors by creating defects in the silicon lattice. These defects degrade the returned image in several ways, one example being a degradation of the Charge Transfer Efficiency, which appears as readout trails in the image data. This can be problematic for the Euclid VIS instrument, which aims to measure the shapes of galaxies to a very high degree of accuracy. Using a special clocking technique called trap pumping, the single defects in the CCDs can be detected and characterised. Being the first instrument in space with this capability, it will provide novel insights into the creation and evolution of radiation-induced defects and give input to the radiation damage correction of the scientific data. We present the status of the radiation damage of the Euclid VIS CCDs and how it has evolved over the first year in space.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Jesper Skottfelt, Matt Wander, Mark Cropper, Ben Dryer, David J. Hall, Richard Hayes, Bradley Kelman, Tom Kitching, Ralf Kohley, David Lagattuta, Zoe Lee-Payne, Patricia Liebing, Richard Massey, Henry Joy McCracken, Reiko Nakajima, and James Nightingale "Tracking radiation damage of Euclid VIS detectors after one year in space", Proc. SPIE 13092, Space Telescopes and Instrumentation 2024: Optical, Infrared, and Millimeter Wave, 130920P (23 August 2024); https://doi.org/10.1117/12.3017996
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KEYWORDS
Silicon

Charge-coupled devices

Sensors

Calibration

Manufacturing

Semiconducting wafers

Space operations

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