Poster + Paper
18 July 2024 RISTRETTO: manufacturing of a single-mode visible high-resolution spectrograph
Bruno Chazelas, Christophe Lovis, Nicolas Blind, Ludovic Genolet, Ian Hughes, Michael Sordet, Robin Schnell, Anthony Carvalho, Maddalena Bugatti, Adrien Crausaz, Samuel Rihs, Pablo Santos Diaz, David Ehrenreich, Emeline Bolmont, Christoph Mordasini, Martin Turbet
Author Affiliations +
Conference Poster
Abstract
The Spectrograph of the RISTRETTO instrument is now currently being manufactured. RISTRETTO is an instrument designed to detect and characterize the reflected light of nearby exoplanets. It combines high contrast imaging and high resolution spectroscopy to detect the light of exoplanets. The high resolution spectrograph subject of this paper uses the doppler effect to disentangle the planetary signal from the stellar light leaks. In this paper we describe the final design of the spectrograph and report the status of its construction. The RISTRETTO spectrograph has seven diffraction limited spaxels. The spectrograph’s resolution is 130000 in the 620-840 nm band. It is designed in a similar way as HARPS and ESPRESSO, being a warm, thermally controlled spectrograph under vacuum. It is designed to be compact and self contained so that it could be installed on different telescopes. It is however tailored to be installed on a nasmyth platform of a VLT telescope. We present updates to the design and the manufacturing of the instrument. In particular we present the performance of the thermal enclosure.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Bruno Chazelas, Christophe Lovis, Nicolas Blind, Ludovic Genolet, Ian Hughes, Michael Sordet, Robin Schnell, Anthony Carvalho, Maddalena Bugatti, Adrien Crausaz, Samuel Rihs, Pablo Santos Diaz, David Ehrenreich, Emeline Bolmont, Christoph Mordasini, and Martin Turbet "RISTRETTO: manufacturing of a single-mode visible high-resolution spectrograph", Proc. SPIE 13096, Ground-based and Airborne Instrumentation for Astronomy X, 130967G (18 July 2024); https://doi.org/10.1117/12.3019978
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KEYWORDS
Spectrographs

Equipment

Sensors

Manufacturing

Vacuum

Temperature metrology

Diffraction

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